Titre : Infrared Spectroscopy for Surface Analysis and Reaction Monitoring.
Endroit : Pavillon J.-A-Bombardier, salle 1035 à 13 h 30.
Hôte : Professeur Christian Pellerin.
Cette conférence sera prononcée (en anglais) par Sergey Shilov, Ph.D., chercheur principal des applications au sein de Briker Optics (Billerica, MA).
Résumé :
Infrared and Raman spectroscopy is the most generally applicable of all characterization tools for quantitative and qualitative analysis. Its breadth of application is remarkable, covering gases, liquids, crystalline and amorphous solids, solid-state defects, surface structures, and surface-adsorbed species. Recent developments in instrumentation allow spectra to be obtained under difficult conditions of low sample transmission, low concentration and rapid spectral change. The latest advances in IR spectroscopy for the surface science applications and fast reaction monitoring will be reviewed in this presentation. The following topics will be discussed in details:
- IR spectroscopy with milliseconds to nanoseconds time resolution;
- Photoreactions studies;
- Fast molecular reorientation under an electric field;
- Optimization of experimental parameters for surface studies;
- Langmuir-Blodgett films on the air-water interface;
- Electrochemistry with FTIR;
- Combination with UHV chamber.
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